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Preparation for TEM of layered samples with fragile microstructure and weak layer interface
Luleå tekniska universitet, Institutionen för teknikvetenskap och matematik, Träteknologi.
Luleå tekniska universitet.
Luleå tekniska universitet.
1999 (engelsk)Inngår i: Microscopy research and technique (Print), ISSN 1059-910X, E-ISSN 1097-0029, Vol. 45, nr 3, s. 198-202Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

The objective of this work was to prepare for transmission electron microscopy (TEM) a layered structure of materials with fragile microstructure. The samples consisted of two layers of different materials, silicon nitride and borosilicate glass, loosely bonded together. The low strength of the sample resulted in fragmentation during more conventional preparation. However, it was possible to prepare the fragments by mounting them in a titanium specimen carrier with aluminium strips as support. After grinding and polishing, a technique of low-angle ion milling was used to obtain electron beam transparent areas at the nitride/glass interface.

sted, utgiver, år, opplag, sider
1999. Vol. 45, nr 3, s. 198-202
HSV kategori
Forskningsprogram
Träteknik; Materialteknik
Identifikatorer
URN: urn:nbn:se:ltu:diva-7085DOI: 10.1002/(SICI)1097-0029(19990501)45:33.0.CO;2-ELokal ID: 5673db50-fd61-11db-b816-000ea68e967bOAI: oai:DiVA.org:ltu-7085DiVA, id: diva2:979972
Merknad
Godkänd; 1999; 20070508 (cira)Tilgjengelig fra: 2016-09-29 Laget: 2016-09-29 Sist oppdatert: 2017-11-24bibliografisk kontrollert

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