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Model-Based Parametric Study of Surface-Breaking Defect Characterization Using Half-Skip Total Focusing Method
Department of Industrial and Materials Science (IMS), Chalmers University of Technology, 41296, Gothenburg, Sweden.ORCID iD: 0000-0003-1181-9014
Division of Subtractive and Additive Manufacturing, University West, 46186, Trollhättan, Sweden.ORCID iD: 0000-0002-4274-1144
Luleå University of Technology, Department of Computer Science, Electrical and Space Engineering, Signals and Systems.ORCID iD: 0000-0002-6216-6132
2023 (English)In: Journal of nondestructive evaluation, ISSN 0195-9298, E-ISSN 1573-4862, Vol. 42, no 2, article id 37Article in journal (Refereed) Published
Abstract [en]

As the demand of structural integrity in manufacturing industries is increasing, the ultrasonic array technique has drawn more attention thanks to its inspection flexibility and versatility. By taking advantage of the possibility of individual triggering of each array element, full matrix capture (FMC) data acquisition strategy has been developed that contains the entire information of an inspection scenario. Total focusing method (TFM) as one of the ultrasonic imaging algorithms, is preferably applied to FMC dataset since it uses all information in FMC to synthetically focus the sound energy at every image pixel in the region of interest. Half-skip TFM (HSTFM) is proposed in multi-mode TFM imaging that involves a backwall reflection wave path, so that the defect profile could be reconstructed for accurate defect characterization. In this paper, a method involving Snell’s law-based wave mode conversion is proposed to account for more reasonable wave propagation time when wave mode conversion happens at backwall reflection in HSTFM. A series of model based simulations (in software simSUNDT) are performed for parametric studies, with the intention of investigating the capability of defect characterization using HSTFM with varying tilt angle and relative position of surface-breaking notch to array probe. The results show that certain TFM modes could help with defect characterization, but the effectiveness is limited with varying defect features. It is inappropriate to address a certain mode for all characterization perspectives but rather a combination, i.e., multi-mode TFM, should be adopted for possible interpretation and characterization of defect features.

Place, publisher, year, edition, pages
Springer Nature, 2023. Vol. 42, no 2, article id 37
Keywords [en]
Ultrasonic array, Defect characterization, Total focusing method, Simulation, simSUNDT
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Research subject
Signal Processing
Identifiers
URN: urn:nbn:se:ltu:diva-97004DOI: 10.1007/s10921-023-00949-7ISI: 000970754800001Scopus ID: 2-s2.0-85153231650OAI: oai:DiVA.org:ltu-97004DiVA, id: diva2:1754626
Note

Validerad;2023;Nivå 2;2023-05-04 (hanlid)

Available from: 2023-05-04 Created: 2023-05-04 Last updated: 2024-03-07Bibliographically approved

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Carlson, Johan E.

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