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Surface characterization of SiC composites exposed to deuterium ions, using atomic force microscopy
Luleå tekniska universitet, Institutionen för teknikvetenskap och matematik, Materialvetenskap.ORCID-id: 0000-0003-1646-569X
1995 (engelsk)Inngår i: Materials Science & Engineering: A, ISSN 0921-5093, E-ISSN 1873-4936, Vol. 201, nr 1-2, s. 277-285Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

We study the influence of deuterium plasma on the surface structure of SiC based composites. The substrates are silicon carbides doped with titanium diboride, aluminium nitride or graphite. A number of surface sensitive techniques are used to characterize the substrates, before and after exposure to low-energy deuterium ions, the main method being atomic force microscopy. The microscope reveals distinct morphological changes on the irradiated samples. The density and surface area of the samples probably influence the content of deuterium in the surfaces. However, this study shows that the amount of graphite aggregated on the surfaces is of crucial importance for the uptake of deuterium.

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1995. Vol. 201, nr 1-2, s. 277-285
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URN: urn:nbn:se:ltu:diva-8316DOI: 10.1016/0921-5093(95)09783-XISI: A1995TB24200029Scopus ID: 2-s2.0-0029386624Lokal ID: 6d1990f0-e6b6-11db-8a98-000ea68e967bOAI: oai:DiVA.org:ltu-8316DiVA, id: diva2:981208
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Godkänd; 1995; 20070409 (ysko)Tilgjengelig fra: 2016-09-29 Laget: 2016-09-29 Sist oppdatert: 2018-07-10bibliografisk kontrollert

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