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Investigation on the oxidation process of SiCO glasses by the means of non-Rutherford backscattering spectrometry
Istituto Nazionale di Fisica Nucleare, Laboratori Nazionali di Legnaro.ORCID-id: 0000-0003-2935-1165
Diportivo di Ingegneria dei Materiali.
Diportivo di Ingegneria dei Materiali.
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2003 (Engelska)Ingår i: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, ISSN 0168-583X, E-ISSN 1872-9584, Vol. 211, nr 3, s. 401-407Artikel i tidskrift (Refereegranskat) Published
Abstract [en]

Ion beam analysis was applied for the first time to characterize the oxidation process of silicon oxycarbides (SiCO) glasses (belonging to the class of polymer-derived ceramics). The technique unveiled the structure of the interface between the silica scale and the SiCO substrate. At the early oxidation stage, a smooth concentration profile was observed between the surface silica layer and the substrate. The role of the free carbon on the kinetics of the oxidation process was studied by preparing samples with different carbon content. A high amount of free C in the SiCO glasses promotes the transition, after long oxidation periods, to a sharp interface between the silica scale and the SiCO substrate. © 2003 Elsevier Science B.V. All rights reserved.

Ort, förlag, år, upplaga, sidor
2003. Vol. 211, nr 3, s. 401-407
Nyckelord [en]
Non-Rutherford backscattering, Oxidation kinetics, Polymer derived ceramics, Silicon oxycarbide glasses
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URN: urn:nbn:se:ltu:diva-11018DOI: 10.1016/S0168-583X(03)01322-3Scopus ID: 2-s2.0-0141963396Lokalt ID: 9e8e3e2a-9e38-4c39-a3bb-bf0e220b100fOAI: oai:DiVA.org:ltu-11018DiVA, id: diva2:983967
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Upprättat; 2003; 20141217 (albvom)

Tillgänglig från: 2016-09-29 Skapad: 2016-09-29 Senast uppdaterad: 2018-10-03Bibliografiskt granskad

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Vomiero, Alberto

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Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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