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The influence of AFM and VSI techniques on the accurate calculation of tribological surface roughness parameters
Luleå University of Technology, Department of Engineering Sciences and Mathematics, Machine Elements.
Luleå University of Technology, Department of Engineering Sciences and Mathematics, Material Science.ORCID iD: 0000-0001-6877-9282
Luleå University of Technology, Department of Engineering Sciences and Mathematics, Material Science.ORCID iD: 0000-0003-1646-569X
Luleå University of Technology, Department of Engineering Sciences and Mathematics, Machine Elements.ORCID iD: 0000-0001-7029-1112
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2013 (English)In: Tribology International, ISSN 0301-679X, E-ISSN 1879-2464, Vol. 57, p. 242-250Article in journal (Refereed) Published
Abstract [en]

Vertical Scanning Interferometry (VSI) may induce optical artefacts in surface topography measurements. The influence of these optical artefacts on the calculation of Rk surface roughness parameters, contact stiffness and flow factors were studied. Two surface measurement techniques were used: Atomic Force Microscopy (AFM) and VSI. Calibration grids were used to make it easier to isolate the causes of these artefacts, while a real engineering surface was used to compare these two techniques in an industrially applied case. It was found that the optical artefacts have a large influence on all the roughness parameters, contact stiffness and flow factors calculated on the calibration grids. However, for the engineering surface the differences between AFM and VSI measurements were much smaller.

Place, publisher, year, edition, pages
2013. Vol. 57, p. 242-250
National Category
Tribology (Interacting Surfaces including Friction, Lubrication and Wear) Other Physics Topics
Research subject
Machine Elements; Experimental physics
Identifiers
URN: urn:nbn:se:ltu:diva-12900DOI: 10.1016/j.triboint.2012.09.001ISI: 000311474800028Scopus ID: 2-s2.0-84866504963Local ID: c0ce4c95-7aa4-4a0a-8aa7-e0d0232b0652OAI: oai:DiVA.org:ltu-12900DiVA, id: diva2:985851
Note
Validerad; 2013; 20120914 (ysko)Available from: 2016-09-29 Created: 2016-09-29 Last updated: 2023-09-05Bibliographically approved

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Spencer, AndrewDobryden, IlliaAlmqvist, NilsAlmqvist, AndreasLarsson, Roland

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