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Roughness determination of plasma-modified surface layers with atomic force microscopy
Luleå tekniska universitet, Institutionen för teknikvetenskap och matematik, Materialvetenskap.ORCID-id: 0000-0003-1646-569X
Royal Institute of Technology, Physics Department-Frescati, Association EURATOM-NFR.
Institute of Plasma Physics, Forschungszentrum Jülich, Association EURATOM-KFA.
1995 (engelsk)Inngår i: Thin Solid Films, ISSN 0040-6090, E-ISSN 1879-2731, Vol. 270, nr 1-2, s. 426-430Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

Graphite surfaces exposed to the deuterium plasma in the TEXTOR tokamak were characterized in detail by means of scanning probe microscopy, ion beam analysis and colorimetry methods. The aim is to study the composition and structure of thin layer deposits formed on surfaces subjected to the tokamak plasma. The surface roughness was measured and parametrized in terms of fractal dimension and scaling constant. Several different methods for the fractal analysis of plasma-exposed surfaces have been critically evaluated. The main emphasis of this paper is on the correlation between surface roughness (fractal parameters), the amount of deposited atoms and the layer thickness.

sted, utgiver, år, opplag, sider
1995. Vol. 270, nr 1-2, s. 426-430
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URN: urn:nbn:se:ltu:diva-13241DOI: 10.1016/0040-6090(95)06933-XISI: A1995TM18700080Scopus ID: 2-s2.0-0029492690Lokal ID: c6d4a240-e6b3-11db-8a98-000ea68e967bOAI: oai:DiVA.org:ltu-13241DiVA, id: diva2:986193
Merknad
Godkänd; 1995; Bibliografisk uppgift: 22nd International Conference on Metallurgical Coatings and Thin Films; 20070409 (ysko)Tilgjengelig fra: 2016-09-29 Laget: 2016-09-29 Sist oppdatert: 2018-07-10bibliografisk kontrollert

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