Observation and theory of the H2* defect in silicon 1994 (English)In: Proceedings of the 17th International Conference on Defects in Semiconductors: Gmunden, Austria, July 18 - 23, 1993 / [ed] Helmut Heinrich, Trans Tech Publications Inc., 1994, p. 845-852Conference paper, Published paper (Refereed)

Place, publisher, year, edition, pages

Trans Tech Publications Inc., 1994. p. 845-852

Series

Materials Science Forum, ISSN 0255-5476 ; 143-147

National Category

Computational Mathematics

Research subject

Scientific Computing

Identifiers

URN: urn:nbn:se:ltu:diva-28177DOI: 10.4028/www.scientific.net/MSF.143-147.845Local ID: 1e251a10-3baa-11dd-8e42-000ea68e967bOAI: oai:DiVA.org:ltu-28177DiVA, id: diva2:1001372

Conference

International Conference on Defects in Semiconductors : 18/07/1993 - 23/07/1993

Note

Godkänd; 1994; 20080616 (ysko)Available from: 2016-09-30 Created: 2016-09-30 Last updated: 2017-11-25Bibliographically approved

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Öberg, Sven

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