Quantitative STEM chemical analysis 1978 (English)In: Scanning electron microscopy / [ed] Om Johari; Robert P Becker, AMF O'Hare, Ill: Scanning Electron Microscopy, Inc. , 1978, p. 655-662Conference paper, Published paper (Refereed)

Place, publisher, year, edition, pages

AMF O'Hare, Ill: Scanning Electron Microscopy, Inc. , 1978. p. 655-662

National Category

Other Materials Engineering

Research subject

Engineering Materials

Identifiers

URN: urn:nbn:se:ltu:diva-29399Local ID: 2df581d0-bc76-11dd-a7c4-000ea68e967bOAI: oai:DiVA.org:ltu-29399DiVA, id: diva2:1002623

Conference

Scanning electron microscopy : 17/04/1978 - 21/04/1978

Note

Godkänd; 1978; Bibliografisk uppgift: Most of the papers included herein were presented at the Scanning Electron Microscopy/1978 meetings held Apr. 17-21 at Hotel Bonaventure, Los Angeles, Calif; 20081127 (ysko)

Available from: 2016-09-30 Created: 2016-09-30 Last updated: 2018-02-06Bibliographically approved

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