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A Cure Rate Model in Reliability for Complex System
Hunan University.
2008 (English)In: 2008 IEEE International Conference on Industrial Engineering and Engineering Management: 2008 IEEE IEEM: Singapore, December8-December11 2008, IEEE Communications Society, 2008, p. 1395-1399Conference paper, Published paper (Refereed)
Abstract [en]

This paper presents a new approach to do reliability analysis for complex system, where a certain fraction of the subsystems is defined as a ¿cure fraction¿ under the consideration that such subsystems are ¿longevous¿ compared with the entire system. Including introducing environment covariates and the joint power prior, the proposed model is developed with the Bayesian survival analysis method, and thus the problems for censored (or truncated) data in reliability tests can be resolved. In addition, a Markov chain Monte Carlo method based on Gibbs sampling is used to dynamically simulate the Markov chain of the parameters¿ posterior distribution. Finally, a numeric example is discussed to demonstrate the proposed model.

Place, publisher, year, edition, pages
IEEE Communications Society, 2008. p. 1395-1399
Identifiers
URN: urn:nbn:se:ltu:diva-31019DOI: 10.1109/IEEM.2008.4738099Scopus ID: 62749107574Local ID: 50e8ec8e-93f7-4d3c-98f4-3f4a849aeff1ISBN: 978-1-4244-2630-0 (print)OAI: oai:DiVA.org:ltu-31019DiVA, id: diva2:1004248
Conference
IEEE International Conference on Industrial Engineering and Engineering Management : 08/12/2008 - 11/12/2008
Note
Upprättat; 2008; 20120508 (linjan)Available from: 2016-09-30 Created: 2016-09-30 Last updated: 2017-11-25Bibliographically approved

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CiteExportLink to record
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Citation style
  • apa
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  • asciidoc
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