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Characterization of thin layers in multi-layered structures: on the problem of finding starting values for numerical solutions to inverse problems
Luleå University of Technology, Department of Computer Science, Electrical and Space Engineering, Signals and Systems.ORCID iD: 0000-0002-6216-6132
Luleå University of Technology, Department of Computer Science, Electrical and Space Engineering, Embedded Internet Systems Lab.
2010 (English)In: 2009 IEEE Ultrasonics Symposium: Rome, Italy, 20 - 23 September 2009, Piscataway, NJ: IEEE Communications Society, 2010, p. 1537-1540Conference paper, Published paper (Refereed)
Abstract [en]

Several model-based techniques have been proposed for characterizing thin layers within multi-layered materials. One problem with these methods is that the models are non-linear with respect to the parameters. Hence, iterative numerical methods must be used estimating the model parameters, i.e. for solving the inverse problem based on measurements. For material structures where the propagation times through the individual layers are shorter than the duration of the transmitted ultrasound pulse, the received waveform will consist of several overlapping echoes. For the parameter estimation to work, good initial guesses of the times of flight are required, which are difficult to obtain due to the severe overlap of the echoes. In this paper we propose a filtering scheme, that compresses the transmitted pulse into a shorter pulse, thus enabling the echoes from within the material structure to be detected. The method is evaluated using simulations on a three-layered material for varying signal-to-noise conditions.

Place, publisher, year, edition, pages
Piscataway, NJ: IEEE Communications Society, 2010. p. 1537-1540
Series
I E E E International Ultrasonics Symposium. Proceedings, ISSN 1051-0117
National Category
Signal Processing Other Electrical Engineering, Electronic Engineering, Information Engineering
Research subject
Signal Processing; Industrial Electronics
Identifiers
URN: urn:nbn:se:ltu:diva-31051DOI: 10.1109/ULTSYM.2009.5442036Local ID: 51872d20-2f0c-11de-bd0f-000ea68e967bISBN: 978-1-4244-4389-5 (print)OAI: oai:DiVA.org:ltu-31051DiVA, id: diva2:1004280
Conference
IEEE International Ultrasonics Symposium : 20/09/2009 - 23/09/2009
Note

Validerad; 2010; 20090422 (johanc)

Available from: 2016-09-30 Created: 2016-09-30 Last updated: 2017-12-20Bibliographically approved

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CiteExportLink to record
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