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The NNO defect in silicon
Luleå University of Technology, Department of Engineering Sciences and Mathematics, Mathematical Science.
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1995 (English)In: Proceedings of the 18th International Conference on Defects in Semiconductors: ICDS-18; Sendai, Japan, July 23 - 28, 1995 / [ed] Masashi Suezawa, Trans Tech Publications Inc., 1995, 791-796 p.Conference paper (Refereed)
Place, publisher, year, edition, pages
Trans Tech Publications Inc., 1995. 791-796 p.
Series
, Materials Science Forum, ISSN 0255-5476 ; 196-201
Research subject
Scientific Computing
Identifiers
URN: urn:nbn:se:ltu:diva-37593DOI: 10.4028/www.scientific.net/MSF.196-201.791Local ID: ba95e030-83fa-11dd-8d17-000ea68e967bOAI: oai:DiVA.org:ltu-37593DiVA: diva2:1011091
Conference
International Conference on Defects in Semiconductors : 23/07/1995 - 28/07/1995
Note
Godkänd; 1995; 20080916 (ysko)Available from: 2016-10-03 Created: 2016-10-03Bibliographically approved

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