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A novel pulsed force mode scanning probe system
2004 (English)Independent thesis Advanced level (professional degree), 20 credits / 30 HE creditsStudent thesis
Abstract [en]

The use of Atomic Force Microscopy (AFM) has over the last few years become more and more popular in biophysics. The study of biological systems demand improvements of the instruments in order to reduce lateral forces between probes and specimen, and to obtain a well defined normal force. Therefore, a new AFM mode was introduced in 1997 called Pulsed Force Mode, which use a dynamic modulation of the sample, resulting in fast delicate scanning. Although this method has been present for almost 7 years, it is only presently incorporated in the latest microscopes on the market. External systems are commercially available but do not allow for detailed analysis of the force interactions between tip and surface. In this work, a Nanoscope II AFM system is extended to run in Pulsed Force Mode, using simple electronics and piezo-ceramics. While this provides delicate topographic imaging, acquiring data of the force interactions require the development of an external computerized system. Such a system is constructed and simple models for evaluating elasticity and adhesion are implemented. Since force data is recorded with high resolution it will be possible to use more elaborate models for describing these surface properties.

Place, publisher, year, edition, pages
2004.
Keyword [en]
Technology, SPM, AFM, Pulsed Force Mode, Nanomechanics
Keyword [sv]
Teknik
Identifiers
URN: urn:nbn:se:ltu:diva-52356ISRN: LTU-EX--04/154--SELocal ID: 97b033a4-0a67-4cb0-b3fa-10f5b69077f5OAI: oai:DiVA.org:ltu-52356DiVA: diva2:1025726
Subject / course
Student thesis, at least 30 credits
Educational program
Engineering Physics, master's level
Examiners
Note
Validerat; 20101217 (root)Available from: 2016-10-04 Created: 2016-10-04Bibliographically approved

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