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A concise guide for the determination of less-studied technology-critical elements (Nb, Ta, Ga, In, Ge, Te) by inductively coupled plasma mass spectrometry in environmental samples
Department F.-A. Forel, University of Geneva.
Luleå University of Technology, Department of Civil, Environmental and Natural Resources Engineering, Geosciences and Environmental Engineering.ORCID iD: 0000-0003-4505-4590
2018 (English)In: Spectrochimica Acta Part B - Atomic Spectroscopy, ISSN 0584-8547, E-ISSN 1873-3565, Vol. 141, p. 80-84Article in journal (Refereed) Published
Abstract [en]

There is an increasing demand for analytical techniques able to measure so-called ‘technology-critical elements’, a set of chemical elements increasingly used in technological applications, in environmental matrices. Nowadays, inductively coupled plasma-mass spectrometry (ICP-MS) has become the technique of choice for measuring trace element concentrations. However, its application is often less straightforward than often assumed. The hints and drawbacks of ICP-MS application to the measurement of a set of less-studied technology-critical elements (Nb, Ta, Ga, In, Ge and Te) is discussed here and concise guidelines given.

Place, publisher, year, edition, pages
Elsevier, 2018. Vol. 141, p. 80-84
National Category
Geochemistry
Research subject
Applied Geochemistry
Identifiers
URN: urn:nbn:se:ltu:diva-67535DOI: 10.1016/j.sab.2018.01.004ISI: 000427336000012Scopus ID: 2-s2.0-85041456764OAI: oai:DiVA.org:ltu-67535DiVA, id: diva2:1180708
Note

Validerad;2018;Nivå 2;2018-02-06 (andbra)

Available from: 2018-02-06 Created: 2018-02-06 Last updated: 2018-04-06Bibliographically approved

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