Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Scalable methods of discrete plant model generation for closed-loop model checking
Department of Electrical Engineering and Automation, Aalto University.
VTT Technical Research Centre of Finland, Espoo.
Luleå University of Technology, Department of Computer Science, Electrical and Space Engineering, Computer Science. Department of Electrical Engineering and Automation, Aalto University.ORCID iD: 0000-0002-9315-9920
2017 (English)In: Proceedings IECON 2017: 43rd Annual Conference of the IEEE Industrial Electronics Society, Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 2017, p. 5483-5488Conference paper, Published paper (Refereed)
Abstract [en]

To facilitate correctness and safety of mission-critical automation systems, formal methods should be applied in addition to simulation and testing. One of such formal methods is model checking, which is capable of verifying complex requirements for the system's model. If both the controller and the controlled plant are formally modeled, then the variant of this technique called closed-loop model checking can be applied. Recently, a technique of automatic plant model generation has been proposed which is applicable in this scenario. This paper continues the work in this direction by presenting two plant model construction approaches which are much more scalable with respect to the previous one, and puts this work into a more practical context. The approaches are evaluated on a case study from the nuclear automation domain

Place, publisher, year, edition, pages
Piscataway, NJ: Institute of Electrical and Electronics Engineers (IEEE), 2017. p. 5483-5488
Series
IEEE Industrial Electronics Society, ISSN 1553-572X
National Category
Computer Systems
Research subject
Dependable Communication and Computation Systems
Identifiers
URN: urn:nbn:se:ltu:diva-68266DOI: 10.1109/IECON.2017.8216949ISI: 000427164805068Scopus ID: 2-s2.0-85046669884ISBN: 9781538611272 (electronic)OAI: oai:DiVA.org:ltu-68266DiVA, id: diva2:1196450
Conference
43rd Annual Conference of the IEEE Industrial Electronics Society, IECON 2017, Bejing, China, 29 October - 1 November 2017
Available from: 2018-04-10 Created: 2018-04-10 Last updated: 2018-05-22Bibliographically approved

Open Access in DiVA

No full text in DiVA

Other links

Publisher's full textScopus

Search in DiVA

By author/editor
Vyatkin, Valeriy
By organisation
Computer Science
Computer Systems

Search outside of DiVA

GoogleGoogle Scholar

doi
isbn
urn-nbn

Altmetric score

doi
isbn
urn-nbn
Total: 62 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf