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Fast Multifrequency Measurement of Nonlinear Conductance
Nanostructure Physics, KTH Royal Institute of Technology, Stockholm, Sweden.
Luleå University of Technology, Department of Engineering Sciences and Mathematics, Material Science.
Luleå University of Technology, Department of Engineering Sciences and Mathematics, Material Science.ORCID iD: 0000-0003-2935-1165
Nanostructure Physics, KTH Royal Institute of Technology, Stockholm, Sweden.
2019 (English)In: Physical Review Applied, E-ISSN 2331-7019, Vol. 11, no 4, article id 044062Article in journal (Refereed) Published
Abstract [en]

We describe a phase-coherent multifrequency lock-in measurement technique that uses the inverse Fourier transform to reconstruct the nonlinear current-voltage characteristic of a nanoscale junction. The method provides separation of the galvanic and displacement currents in the junction and easy cancellation of the parasitic displacement current from the measurement leads. These two features allow us to overcome traditional limitations imposed by the low conductance of the junction and the high capacitance of the leads, thus providing an increase in measurement speed of several orders of magnitude. We demonstrate the method in the context of conductive atomic force microscopy, acquiring current-voltage characteristics at every pixel while scanning at standard imaging speed.

Place, publisher, year, edition, pages
American Physical Society, 2019. Vol. 11, no 4, article id 044062
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Experimental Physics
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URN: urn:nbn:se:ltu:diva-73933DOI: 10.1103/PhysRevApplied.11.044062ISI: 000465185700002Scopus ID: 2-s2.0-85064857475OAI: oai:DiVA.org:ltu-73933DiVA, id: diva2:1315700
Note

Validerad;2019;Nivå 2;2019-05-14 (johcin)

Available from: 2019-05-14 Created: 2019-05-14 Last updated: 2019-05-14Bibliographically approved

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Gilzad Kohan, MojtabaVomiero, Alberto

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