Parallel Deep CNN Structure for Glioma Detection and Classification via Brain MRI Images
2019 (English)In: IEEE-ICM 2019 CAIRO-EGYPT: The 31st International Conference on Microelectronics, IEEE, 2019, p. 304-307Conference paper, Published paper (Other academic)
Abstract [en]
Although most brain tumor diagnosis studies have focused on tumor segmentation and localization operations, few studies have focused on tumor detection as a time- and effort-saving process. This study introduces a new network structure for accurate glioma tumor detection and classification using two parallel deep convolutional neural networks (PDCNNs). The proposed structure is designed to identify the presence and absence of a brain tumor in MRI images and classify the type of tumor images as high-grade gliomas (HGGs, i.e., glioblastomas) or low-grade gliomas (LGGs). The introduced PDCNNs structure takes advantage of both global and local features extracted from the two parallel stages. The proposed structure is not only accurate but also efficient, as the convolutional layers are more accurate because they learn spatial features, and they are efficient in the testing phase since they reduce the number of weights, which reduces the memory usage and runtime. Simulation experiments were accomplished using an MRI dataset extracted from the BraTS 2017 database. The obtained results show that the proposed parallel network structure outperforms other detection and classification methods in the literature.
Place, publisher, year, edition, pages
IEEE, 2019. p. 304-307
Series
International Conference on Microelectronics, ICM
Keywords [en]
Computer-aided diagnosis, brain tumor detection, deep learning, convolutional neural networks, glioma classification
National Category
Information Systems, Social aspects
Research subject
Information Systems
Identifiers
URN: urn:nbn:se:ltu:diva-78648DOI: 10.1109/ICM48031.2019.9021872ISI: 000555677600071Scopus ID: 2-s2.0-85082101535OAI: oai:DiVA.org:ltu-78648DiVA, id: diva2:1426243
Conference
31st IEEE International Conference on Microelectronics (ICM2019), December 15-18, 2019, Cairo, Egypt
Note
ISBN för värdpublikation: 978-1-7281-4058-2
2020-04-242020-04-242024-12-03Bibliographically approved