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Permanent charged domain walls under tip-poling engineering
Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China.ORCID iD: 0000-0002-6324-6193
Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China.
Science and Technology on Electronic Test and Measurement Laboratory, North University of China, Taiyuan 030051, China.
School of Mechanical Engineering, North University of China, Taiyuan 030051, China.ORCID iD: 0000-0002-7110-4611
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2021 (English)In: Journal of Materials Chemistry C, ISSN 2050-7526, E-ISSN 2050-7534, Vol. 9, no 44, p. 15797-15803Article in journal (Refereed) Published
Abstract [en]

Charged domain walls (CDWs) have attracted considerable attention owing to their tunable properties related to high-density information storage and nanoelectronics devices. The excellent time endurance of conductivity is a pressing need, which is directly related to the domain stability and boundary conditions. In this study, we propose an effective method to promote the permanent formation of charged domain walls aimed with tip-induced electric fields. The permanent domain structures and CDWs are attributed to the robust stimulus with tip dimensions combined with effective screening conditions. This interesting conductivity near the domain walls is three orders of magnitude higher than the domain inner, and exhibits attractive anti-fatigue properties with the value of ∼60 pA for the duration of more than one month. In addition, the tunable mechanism of CDWs in LiNbO3 thin films is related to carrier gathering near the domain walls for the inclined boundary. These inclined head-to-head domain walls exhibit conductive features only along the negative direction, which can be modulated by the application of a sub-coercive voltage. The results demonstrate the stable manipulation of domain reversal and charged domain walls in LiNbO3 thin films, highlighting them as a critical component, especially for multiple-state logic circuits and potential ferroelectric diode applications in non-volatile memories and nanoelectronics devices.

Place, publisher, year, edition, pages
Royal Society of Chemistry, 2021. Vol. 9, no 44, p. 15797-15803
National Category
Condensed Matter Physics
Research subject
Applied Physics
Identifiers
URN: urn:nbn:se:ltu:diva-87704DOI: 10.1039/d1tc03671hISI: 000709448400001Scopus ID: 2-s2.0-85120155968OAI: oai:DiVA.org:ltu-87704DiVA, id: diva2:1607378
Note

Validerad;2021;Nivå 2;2021-11-30 (johcin);

Forskningsfinansiär: The National Key R&D Program of China (2019YFF0301802, 2019YFB2004802, and 2018YFF0300605); the National Natural Science Foundation of China (62171415, and 51975541); Key R&D Projects of Shanxi Province (20201101015); Shanxi Scholarship Council of China (2021-112)

Available from: 2021-11-01 Created: 2021-11-01 Last updated: 2021-12-13Bibliographically approved

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Wang, Xiangjian

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