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Presentation Attack Detection in Iris Recognition through Convolution Block Attention Module
ABV-Indian Institute of Information Technology and Management Gwalior, Gwalior, India.
ABV-Indian Institute of Information Technology and Management Gwalior, Gwalior, India.
ABV-Indian Institute of Information Technology and Management Gwalior, Gwalior, India.
Luleå University of Technology, Department of Computer Science, Electrical and Space Engineering, Embedded Internet Systems Lab.ORCID iD: 0000-0003-0221-8268
2022 (English)In: 2022 IEEE International Joint Conference on Biometrics (IJCB), IEEE, 2022Conference paper, Published paper (Refereed)
Abstract [en]

Presentation Attacks (PAs) are a common spoofing mechanism in biometric authentications, especially iris-based models. The detection of these attacks is useful for distinguishing whether a sensor is presented with a live biometric or impersonated biometric through a recording, printout or spoof In recent studies, Convolutional Neural Networks have shown exceptional performance in detecting these attacks. In this paper, we propose an attention-based iris PA detection (PAD) termed d-CBAM that uses a convolution block attention mechanism introduced between the dense blocks of DenseNet. The core of this work is inspired by the use of DenseNet as a feature extractor i.e, feature maps from the last dense block are taken and passed to the attention maps. We have tested d-CBAM on the benchmark Clarkson, Notre Dame and NDCLD15 datasets, over which d-CBAM has shown better results in comparison to some traditional PAD solutions such as DenseNet, Spoof Net and Meta-Fusion. The error metrics (APCER and BPCER) were also noted to be competitive with the state-of-the-art.

Place, publisher, year, edition, pages
IEEE, 2022.
Series
IEEE International Conference on Biometrics, Theory, Applications and Systems, ISSN 2474-9680, E-ISSN 2474-9699
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Research subject
Machine Learning
Identifiers
URN: urn:nbn:se:ltu:diva-95581DOI: 10.1109/IJCB54206.2022.10007966ISI: 000926877700037Scopus ID: 2-s2.0-85147254158ISBN: 978-1-6654-6394-2 (electronic)OAI: oai:DiVA.org:ltu-95581DiVA, id: diva2:1735818
Conference
2022 IEEE International Joint Conference on Biometrics (IJCB), October 10-13, 2022, Abu Dhabi, United Arab Emirates
Available from: 2023-02-10 Created: 2023-02-10 Last updated: 2024-03-07Bibliographically approved

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De, Kanjar

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