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Automatic Generation of Repair Suggestions for Control Logic of I&C Systems
Department of Electrical Engineering and Automation, Aalto University, Espoo, Finland.
VTT Technical Research Centre of Finland Ltd., Espoo, Finland.
Luleå University of Technology, Department of Computer Science, Electrical and Space Engineering, Computer Science. Department of Electrical Engineering and Automation, Aalto University, Espoo, Finland.ORCID iD: 0000-0002-9315-9920
2023 (English)In: IECON 2023 - 49th Annual Conference of the IEEE Industrial Electronics Society, Institute of Electrical and Electronics Engineers (IEEE), 2023Conference paper, Published paper (Refereed)
Abstract [en]

We present an approach for suggesting possible repairs for the control logic of I&C systems implemented in the form of function block diagrams (FBDs) during the design phase. Each FBD has a set of functional requirements formulated using linear temporal logic (LTL). To ensure the correctness of the implementation, an FBD is translated into SMV, the language of the NuSMV model checker, which verifies the model against its properties. If a property does not hold, NuSMV generates a counterexample. In previous works, we developed methods on visual counterexample explanation using both, the failing LTL formula and the FBD itself. The current work continues in this direction and utilizes the results of the counterexample explanation to suggest fixes to the FBD considering the failed properties and the whole set of requirements. We propose three strategies for fixes generation and experiment on the examples of the logic from the nuclear domain.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2023.
Series
Annual Conference of Industrial Electronics Society, ISSN 1553-572X, E-ISSN 2577-1647
Keywords [en]
FBD repair, fix suggestions, functional requirements, I&C control logic, model checking, safety-critical systems
National Category
Computer and Information Sciences
Research subject
Dependable Communication and Computation Systems
Identifiers
URN: urn:nbn:se:ltu:diva-103546DOI: 10.1109/IECON51785.2023.10311970Scopus ID: 2-s2.0-85179503105OAI: oai:DiVA.org:ltu-103546DiVA, id: diva2:1825578
Conference
49th Annual Conference of the IEEE Industrial Electronics Society (IECON 2023), Singapore, Singapore, October 16-19, 2023
Note

Funder: innish Research Programme on NuclearPower Plant Safety 2018-2022 (SAFIR 2022);

ISBN for host publication: 979-8-3503-3183-7 (print), 979-8-3503-3182-0 (electronic)

Available from: 2024-01-09 Created: 2024-01-09 Last updated: 2024-01-09Bibliographically approved

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Vyatkin, Valeriy

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