Ben-Gurion University of Negev, P.O.B. 653, Beer-Sheva, 84105, Israel.
Atominstitut, Vienna University of Technology, 1020, Vienna, Austria.
Atominstitut, Vienna University of Technology, 1020, Vienna, Austria.
CNRS UMR 6508, CNRS/CRISMAT, 6, Bd du Maréchal Juin, 14050, Caen, France.
Institute for Superhard Materials, National Academy of Sciences of Ukraine, Kiev, 04074, Ukraine.
Institute for Superhard Materials, National Academy of Sciences of Ukraine, Kiev, 04074, Ukraine.
Hyper Tech Research, Inc., 1275 Kinnear Road, Columbus, Columbus, OH, 43212, USA.
Institute for Superhard Materials, National Academy of Sciences of Ukraine, Kiev, 04074, Ukraine.
Institute for Problems in Material Science of the National Academy of Sciences of Ukraine, 3 Krzhizhanovsky Street, Kiev, 03680, Ukraine.
Institut für Technische Physik, 3640, Forschungszentrum Karlsruhe, Karlsruhe, 76021, Germany.
H.C. Starck GmbH, Goslar, 38642, Germany.
Institute for Superhard Materials, National Academy of Sciences of Ukraine, Kiev, 04074, Ukraine.
Hyper Tech Research, Inc., 1275 Kinnear Road, Columbus, OH, 43212, USA.
Institut für Photonische Technologien, Jena, 07745, Germany.
Institut für Photonische Technologien, Jena, 07745, Germany.
Ben-Gurion University of Negev, P.O.B. 653, Beer-Sheva, 84105, Israel.
Institute for Superhard Materials, National Academy of Sciences of Ukraine, Kiev, 04074, Ukraine.
Institute for Superhard Materials, National Academy of Sciences of Ukraine, Kiev, 04074, Ukraine.
Institute for Superhard Materials, National Academy of Sciences of Ukraine, Kiev, 04074, Ukraine.
Institute for Superhard Materials, National Academy of Sciences of Ukraine, Kiev, 04074, Ukraine.
Institut für Photonische Technologien, Jena, 07745, Germany.
Institut für Photonische Technologien, Jena, 07745, Germany.
Institut für Photonische Technologien, Jena, 07745, Germany.
Institute for Superhard Materials of the National Academy of Sciences of Ukraine, Kiev, 04074, Ukraine.
Institute for Superhard Materials, National Academy of Sciences of Ukraine.
2011. Vol. 24, no 5, p. 137-150