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Application of a cure rate model in reliability analysis for masked data
ORCID iD: 0000-0002-7458-6820
2007 (Chinese)In: Chinese Journal of Mathematics in Practice and Theory, ISSN 1000-0984, Vol. 7, p. 69-75Article in journal (Refereed) Published
Place, publisher, year, edition, pages
2007. Vol. 7, p. 69-75
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URN: urn:nbn:se:ltu:diva-3859DOI: 10.3969/j.issn.1000-0984.2007.07.013Local ID: 1b4b6b5a-07b8-43cf-bfd3-768d35ad6535OAI: oai:DiVA.org:ltu-3859DiVA, id: diva2:976721
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Upprättat; 2007; 20120508 (linjan)

Available from: 2016-09-29 Created: 2016-09-29 Last updated: 2020-04-23Bibliographically approved

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Lin, Jing

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