A modified computer-controlled high-temperature x-ray diffractometer with good stability and an upper temperature limit of more than 2300 K is described. A critical test of the system, determining the thermal expansion of Pt, Ni and AlN, showed close agreement with dilatometric and literature data. Lattice thermal expansion data of CrB2 and TiB2 up to 2100 K were also determined
Godkänd; 1993; 20070426 (cira)