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The use of plackett-burman designs to construct split-plot designs
Department of Industrial Engineering, Arizona State University, Tempe.ORCID iD: 0000-0003-4222-9631
Isenberg School of Management, University of Massachusetts Amherst, Eugene M. Isenberg School of Management, University of Massachusetts Amherst.
2005 (English)In: Technometrics, ISSN 0040-1706, E-ISSN 1537-2723, Vol. 47, no 4, p. 495-501Article in journal (Refereed) Published
Abstract [en]

When some factors are hard to change and others are relatively easier, split-plot experiments are often an economic alternative to fully randomized designs. Split-plot experiments, with their structure of subplot arrays imbedded within whole-plot arrays, have a tendency to become large, particularly in screening situations when many factors are considered. To alleviate this problem, we explore, for the case of two-level designs, various ways to use orthogonal arrays of the Plackett-Burman type to reduce the number of individual tests. General construction principles are outlined, and the resulting alias structure is derived and discussed

Place, publisher, year, edition, pages
2005. Vol. 47, no 4, p. 495-501
National Category
Reliability and Maintenance
Research subject
Quality Technology and Management
Identifiers
URN: urn:nbn:se:ltu:diva-4712DOI: 10.1198/004017005000000427Local ID: 2b249859-fb46-4b63-8f17-c658ddbd4045OAI: oai:DiVA.org:ltu-4712DiVA, id: diva2:977586
Note
Upprättat; 2005; 20150604 (andbra)Available from: 2016-09-29 Created: 2016-09-29 Last updated: 2018-03-16Bibliographically approved

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Kulahci, Murat

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