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Systematic and random errors in electronic speckle photography
Luleå University of Technology, Department of Engineering Sciences and Mathematics, Fluid and Experimental Mechanics.ORCID iD: 0000-0003-4879-8261
1994 (English)In: Applied Optics, ISSN 1559-128X, E-ISSN 2155-3165, Vol. 33, no 31, p. 7461-7471Article in journal (Refereed) Published
Abstract [en]

Electronic speckle photography offers a simple and fast technique for measuring in-plane displacement fields in solid and fluid mechanics. Errors from undersampling, illumination divergence, and displacement magnitude have been analyzed and measured. The nature of the systematic error is such that a drift toward the closest integral pixel value is introduced. Because of the finite extent of the sensor area, considerable undersampling is tolerable before systematic errors occur. The random errors are mainly dependent on the effective f-number of the imaging system and speckle decorrelation introduced by object displacement. When sampling at a rate of ~70% of the Nyquist frequency, we avoided systematic errors and minimized random errors

Place, publisher, year, edition, pages
1994. Vol. 33, no 31, p. 7461-7471
National Category
Applied Mechanics
Research subject
Experimental Mechanics
Identifiers
URN: urn:nbn:se:ltu:diva-5416DOI: 10.1364/AO.33.007461Local ID: 3835a430-bb57-11db-b560-000ea68e967bOAI: oai:DiVA.org:ltu-5416DiVA: diva2:978290
Note
Godkänd; 1994; 20061026 (cira)Available from: 2016-09-29 Created: 2016-09-29 Last updated: 2017-11-24Bibliographically approved

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