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Metallurgical applications of scanning transmission electron microscopy
Luleå tekniska universitet.
1977 (English)In: Journal of Materials Science, ISSN 0022-2461, E-ISSN 1573-4803, Vol. 12, no 5, p. 857-868Article in journal (Refereed) Published
Abstract [en]

It is shown that scanning transmission microscopy (STEM) has followed two main lines of development, the pure STEM based upon a field emission electron source in which the emphasis is given to high resolution, and a combined system in which STEM is an attachment to a conventional transmission microscope (TEM+STEM). When used in combination with an energy dispersive X-ray spectrometer, the combined TEM+STEM system is shown to be extremely versatile and possibly the more useful for the applied metallurgist. The high vacuum requirements of pure STEM, however, make this system suitable to be used in conjunction with an Auger spectrometer. Examples of the various microanalysis facilities of STEM are given in the article, including micro-diffraction, rocking-beam channelling patterns, qualitative and quantitative X-ray spectroscopy analysis, particle analysis, and in situ experimentation. The controversial subject of whether thicker specimens can be studied in STEM compared with conventional TEM is also discussed

Place, publisher, year, edition, pages
1977. Vol. 12, no 5, p. 857-868
National Category
Other Materials Engineering
Research subject
Engineering Materials
Identifiers
URN: urn:nbn:se:ltu:diva-11049DOI: 10.1007/BF00540966ISI: A1977DD47600002Scopus ID: 2-s2.0-0017493337Local ID: 9f26d170-ec37-11dc-9508-000ea68e967bOAI: oai:DiVA.org:ltu-11049DiVA, id: diva2:983998
Note

Godkänd; 1977; 20080307 (cira)

Available from: 2016-09-29 Created: 2016-09-29 Last updated: 2018-07-10Bibliographically approved

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