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Characterization and compensation of decorrelations in interferometric set-ups using active optics
Optronic, Box 733, SE 931 27 Skellefteå, Sweden.
Luleå tekniska universitet, Institutionen för tillämpad fysik, maskin- och materialteknik.
2007 (engelsk)Inngår i: Optical Measurement Systems for Industrial Inspection V / [ed] Wolfgang Osten; Christophe Gorecki; Erik L. Novak, Bellingham, Wash.: SPIE - The International Society for Optics and Photonics, 2007, artikkel-id 661619Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

Decorrelation in an interferometric set-up appears due to movements of the speckle pattern. In the case of rigid body movements the effect of decorrelation severely limits the performance of speckle interferometers. If the movement is larger than the speckle size the wanted phase information of the deformation is lost. Phase modulating spatial light modulators (SLMs) provide a new method to non-mechanically deflect and shape light. By using the SLM for scanning the field-of-view and focusing at different distances it is possible to measure intensity speckle patterns in a three-dimensional volume. These intensity images can then be cross correlated to give a three-dimensional correlation coefficient of the speckle pattern. If an SLM is utilized in an interferometric set-up it is possible to compensate for unwanted movements during an experiment. The measured correlation coefficient will then provide information regarding how large movements that are allowed with maintained performance of the interferometer. It is shown that for large movements the SLM can be used to retrieve phase maps.

sted, utgiver, år, opplag, sider
Bellingham, Wash.: SPIE - The International Society for Optics and Photonics, 2007. artikkel-id 661619
Serie
Proceedings of SPIE, the International Society for Optical Engineering, ISSN 0277-786X ; 6616
HSV kategori
Forskningsprogram
Experimentell mekanik
Identifikatorer
URN: urn:nbn:se:ltu:diva-35236DOI: 10.1117/12.726054ISI: 000251243000039Scopus ID: 2-s2.0-36248967092Lokal ID: 9b010410-79a6-11dd-b356-000ea68e967bISBN: 9780819467584 (tryckt)OAI: oai:DiVA.org:ltu-35236DiVA, id: diva2:1008488
Konferanse
Optical Measurement Systems for Industrial Inspection : 18/07/2007 - 18/07/2007
Merknad

Validerad; 2007; 20080903 (ysko)

Tilgjengelig fra: 2016-09-30 Laget: 2016-09-30 Sist oppdatert: 2025-12-23bibliografisk kontrollert

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Hällstig, EmilSvanbro, Angelica

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