A study of failure mechanisms in CMOS & BJT ICs and their effect on device reliability 2010 (English)In: Proceedings of 2nd International Conference on Reliability, Safety and Hazard - ICRESH 2010: Mumbai Dec 15-16, 2010, Piscataway, NJ: IEEE Communications Society, 2010, p. 425-430Conference paper, Published paper (Refereed)

Place, publisher, year, edition, pages

Piscataway, NJ: IEEE Communications Society, 2010. p. 425-430

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Other Civil Engineering

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URN: urn:nbn:se:ltu:diva-34159DOI: 10.1109/ICRESH.2010.5779587Scopus ID: 2-s2.0-79959676515Local ID: 8466cbfe-e5a4-46fb-ba9b-dd8e8ab6a97eISBN: 978-1-4244-8344-0 (print)OAI: oai:DiVA.org:ltu-34159DiVA, id: diva2:1007409

Conference

International Conference on Reliability, Safety and Hazards : 14/12/2010 - 16/12/2010

Note

Upprättat; 2010; 20130312 (aditha)

Available from: 2016-09-30 Created: 2016-09-30 Last updated: 2025-10-22Bibliographically approved

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Thaduri, Adithya

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