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Theoretical study of cubic polytype inclusions in 4H-SiC
Department of Physics and Measurement Technology, Linköping University, SE-581 83 Linköping, Sweden.
Department of Physics and Measurement Technology, Linköping University, SE-581 83 Linköping, Sweden; Dept. G, ABB Corporate Research, SE-721 78 Västerås, Sweden.
Luleå University of Technology, Department of Engineering Sciences and Mathematics, Mathematical Science.ORCID iD: 0000-0002-0292-1159
Department of Physics, University of Newcastle, Newcastle upon Tyne NE1 7RU, United Kingdom.
2002 (English)In: Silicon carbide and related materials: ICSCRM2001 : proceedings of the International Conference on Silicon Carbide and Related Materials 2001, Tsukuba, Japan, October 28 - November 2, 2001 / [ed] S. Yoshida, Zürich-Uetikon: Trans Tech Publications Inc., 2002, Vol. 1, p. 533-536Conference paper, Published paper (Refereed)
Abstract [en]

First-principles density-functional calculations of the band structure and wave functions around narrow 3C-like inclusions in 4H-SiC have been performed. 3C-like inclusions of various thicknesses, corresponding to two, three, and four stacking faults in neighbouring basal planes, have been investigated. The results for the number of bound states in the inclusion, their energies, and wave functions are well described by a simple one-dimensional quantum-well square potential. The quantum-well property of these inclusions suggests that 3C-like regions in 4H-SiC are efficient planar traps for conduction band electrons.

Place, publisher, year, edition, pages
Zürich-Uetikon: Trans Tech Publications Inc., 2002. Vol. 1, p. 533-536
Series
Materials Science Forum, ISSN 0255-5476 ; 389
Keywords [en]
First-principles calculations, Polytype inclusions, Stacking faults
National Category
Computational Mathematics
Research subject
Scientific Computing
Identifiers
URN: urn:nbn:se:ltu:diva-35882DOI: 10.4028/www.scientific.net/msf.389-393.533ISI: 000177321100128Scopus ID: 2-s2.0-33646629186Local ID: a97f7050-c73f-11db-98d9-000ea68e967bISBN: 0-87849-894-X (print)OAI: oai:DiVA.org:ltu-35882DiVA, id: diva2:1009136
Conference
International Conference on Silicon Carbide and Related Materials : 28/10/2001 - 02/11/2001
Note

Validerad; 2002; 20070228 (kani)

Available from: 2016-09-30 Created: 2016-09-30 Last updated: 2025-10-22Bibliographically approved

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Öberg, Sven

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