Intra-Domain Transfer Learning for Fault Diagnosis with Small Samples
2022 (English)In: Applied Sciences, E-ISSN 2076-3417, Vol. 12, no 14, article id 7032Article in journal (Refereed) Published
Abstract [en]
The concept of deep transfer learning has spawned broad research into fault diagnosis with small samples. A considerable covariate shift between the source and target domains, however, could result in negative transfer and lower fault diagnosis task accuracy. To alleviate the adverse impacts of negative transfer, this research proposes an intra-domain transfer learning strategy that makes use of knowledge from a data-abundant source domain that is akin to the target domain. Concretely, a pre-trained model in the source domain is built via a vanilla transfer from an off-the-shelf inter-domain deep neural network. The model is then transferred to the target domain using shallow-layer freezing and finetuning with those small samples. In a case study involving rotating machinery, where we tested the proposed strategy, we saw improved performance in both training efficiency and prediction accuracy. To demystify the learned neural network, we propose a heat map visualization method using a channel-wise average over the final convolutional layer and up-sampling with interpolation. The findings revealed that the most active neurons coincide with the corresponding fault characteristics.
Place, publisher, year, edition, pages
MDPI, 2022. Vol. 12, no 14, article id 7032
Keywords [en]
fault diagnosis, transfer learning, time-frequency spectrum, small samples, heat map
National Category
Other Engineering and Technologies
Research subject
Operation and Maintenance Engineering
Identifiers
URN: urn:nbn:se:ltu:diva-92242DOI: 10.3390/app12147032ISI: 000833882400001Scopus ID: 2-s2.0-85137365305OAI: oai:DiVA.org:ltu-92242DiVA, id: diva2:1684497
Note
Validerad;2022;Nivå 2;2022-08-11 (hanlid);
Funder: National Science Foundation of China, NSFC (71801045); DGUT (GC300502-46);
Part of special issue: "Industrial AI: Applications in Fault Detection, Diagnosis, and Prognosis"
2022-07-262022-07-262026-01-07Bibliographically approved